High-Sensitivity, Low-Cost, Surface-Acoustic-Wave Based Microscale
Thermogravimetric Analyzer for Nanoparticle Characterization
X-wave Innovations (XII) proposes a high-sensitivity, high-accuracy, low-cost, surface-acoustic-wave based microscale thermogravimetric analyzer (SAW-l-TGA) for nanoparticles. The proposed approach is based on XII-developed surface acoustic wave sensor technology, which can simultaneously provide accurate temperature and mass change measurements at elevated temperatures and in real time.
Phase II Awards:
Information Technology & Cybersecurity
WS-BD Conformant Handheld Multi-biometric Acquisition System
Fulcrum Biometrics will develop a new wireless multi-modal biometric acquisition system that will deliver biometrics information securely over standard Web services. The objective is to produce a hardware design and software package ready for mass production.
Query-Based Interoperability for Simulation of Composite Structures
Intact Solutions will design and implement a query-based approach to interoperable modeling and simulation of composite material structures. With use-case scenarios for modeling and simulation of as-manufactured material composite structures, the company will develop commercial strength software that demonstrates the approach on a current challenge faced by U.S. manufacturers.
Inline Material Electrical Characterization Sensor (IMECS)
PaneraTech, under the NIST SBIR Phase I program, demonstrated feasibility of an Inline Material Electrical Characterization Sensor (IMECS) for non-contact evaluation of nanofiber films during manufacturing. Under the Phase II program, PaneraTech will build a fully functional prototype, which will be ready for transitioning to market.
STAR Cryoelectronics (
Improved Microcalorimeter Detectors for X-ray Chemical Shift Mapping
STAR Cryoelectronics will fabricate improved transition-edge sensor detectors with an energy resolution of 2 eV for 1.5 keV X-rays and integrate them into an X-ray spectrometer for chemical shift mapping. This will enhance significantly the power of X-ray spectroscopy as an analytical tool for a broad range of applications.
An Automated Lapping Apparatus and Process for High-Precision Random Profile Roughness Specimen Fabrication
Measurement and quality control for smooth engineering surfaces are becoming increasingly important in modern science and technology due to critical connections to engineering functions and high production costs. This project will produce an automated apparatus for manufacturing high-precision, random profile roughness standard reference material specimens for NIST to use in supporting U.S. manufacturing.
The SBIR program was established by
As a non-regulatory agency of the
TNS 30VianaGem - 130725-4434919 30VianaGem
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