The company, which provides silicon wafer reclaim services, said the installation of the most advanced Inductively Coupled Plasma Mass Spectrometer (IPCMS) system provides it with the ability to measure surface metal contamination present on silicon wafers to orders of magnitude lower than currently specified on the semiconductor technology roadmap to support its customers.
The ICPMS system is a significant addition to
Hispanic #1 Breaking News for Entrepreneurs, Professionals and Small Business Owners - HispanicBusiness.com
SEPTEMBER 22, 2014
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