News Column

New Microprocessors and Microsystems Study Findings Have Been Reported from Royal Institute of Technology (Area-efficient high-coverage LBIST)

September 10, 2014

By a News Reporter-Staff News Editor at Electronics Newsweekly -- Investigators publish new report on Microprocessors and Microsystems. According to news reporting originating from Stockholm, Sweden, by VerticalNews correspondents, research stated, "Logic Built-In Self Test (LBIST) is a popular technique for applications requiring in-field testing of digital circuits. LBIST incorporates test generation and response-capture on-chip."

Our news editors obtained a quote from the research from the Royal Institute of Technology, "It requires no interaction with a large, expensive tester. LBIST offers test time reduction due to at-speed test pattern application, makes possible test data re-usability at many levels, and enables test-ready IP. However, the traditional pseudo-random pattern-based LBIST often has a low test coverage. This paper presents a new method for on-chip generation of deterministic test patterns based on registers with non-linear update. Our experimental results on 7 real designs show that the presented approach can achieve a higher stuck-at coverage than the test point insertion with less area overhead."

According to the news editors, the research concluded: "We also show that registers with non-linear update are asymptotically smaller than memories required to store the same test patterns in a compressed form."

For more information on this research see: Area-efficient high-coverage LBIST. Microprocessors and Microsystems, 2014;38(5):368-374. Microprocessors and Microsystems can be contacted at: Elsevier Science Bv, PO Box 211, 1000 Ae Amsterdam, Netherlands. (Elsevier -; Microprocessors and Microsystems -

The news editors report that additional information may be obtained by contacting N. Li, Royal Inst Technol, Sch Informat & Commun Technol, Stockholm, Sweden.

Keywords for this news article include: Stockholm, Sweden, Europe, Microprocessors and Microsystems

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Source: Electronics Newsweekly

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