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United States : NATIONAL INSTRUMENTS describes several new instruments for automated test and research applications

August 7, 2014

National Instruments has unveiled several new instruments for automated test and research applications in mobile, semiconductor, automotive and aerospace/defence sectors, at the recently held NIWeek technology conference.

The newest software-designed instruments include :

The PXIe-5171R software-designed oscilloscope integrates an FPGA for inline signal processing, protocol decoding, and advanced trigger plans with no dead time. This 8-channel oscilloscope has 14-bit resolution, a sample rate of 250MS/s, and 250MHz of analogue bandwidth with a software-selectable 100MHz anti-alias filter.

The PXIe-5171R's high-throughput PXI Express x8 Gen2 interface can stream 3.2 GB/s across the PXI bus to the host to, for instance stream acquired data to a RAID system.

The PXIe-5668R vector signal analyser (VSA), which has 765MHz bandwidth, aims to meet the needs of applications like wireless communications, radio frequency integrated circuit (RFIC) characterisation, RADAR test, and spectrum monitoring/signal intelligence.

By adding triggering or signal-processing routines, a LabVIEW-programmable Xilinx Kintex-7 FPGA helps in customizing the instrument.

The PXIe-5624R is a 2GS/s AC-coupled oscilloscope/digitiser, which will be utilized in superheterodyne receiver architectures, features an onboard digital downconverter, which turns IF signals to I/Q data.

In this instrument a LabVIEW-programmable Xilinx Kintex-7 FPGA that help in customizing triggers or signal processing routines.

A 12.5Gbit/s, 8 TX/8 RX lane super fast serial instrument also exists. The PXIe-6591R super fast serial instrument aims to ratify, interface through, and test serial protocols.

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Source: TendersInfo (India)

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