News Column

Electron Microscopes for EPFL - Lausanne EPFL & Sion

August 16, 2014

Tenders are invited for Electron Microscopes for EPFL - Lausanne EPFL & Sion The EPFL intends two transmission electron microscopes (TEM) and scanning electron microscopes two (SEM) to obtain, which are in Sion Campus and the EPFL and installed in the electron microscopy center CIME. The TEM and SEM are a serve micro and nano-structure of samples in the field of materials science, physics and chemistry to investigate. The units are of a large number of users (~ 100) for research as well as students (supervised) be used for semester projects. They are used both for training and demonstration purposes as well as for routine work. The microscopes are to serve the user to become familiar with the current techniques of transmission electron microscopy and scanning electron microscopy. The adjustment of the electron optics should be fast, stable and easy to do on a clear user interface. Since often several samples, the devices need to be investigated in a single operation have high mechanical and electrical stability, be equipped with eucentric sample tables and enable a fast and safe sample exchange. The "Serial Block-Face Scanning" electron microscope (SBFSEM) will be used mainly by research groups in the field of life sciences. This microscope consists of a scanning electron microscope with a built-in-situ-microtome, which allows the serial imaging of biological samples. The microscope is used primarily for imaging biological samples embedded in synthetic resin, in particular nervous tissue, and cultured mammalian cells. The purpose of this imaging method is to collect images through the sample series, and thus a better understanding of the morphology of the samples. The microscope is mainly used by a limited number of experienced Elektronenmikroskopisten whose samples have shown for several hours to obtain a large and gap-free number of image series. The complete device includes a scanning electron microscope with a mounted in the vacuum chamber microtome system, which can also be taken out. The scanning electron microscope requires a high stability with respect to mechanical drift and the electronic orientations. It must also provide a user interface, which may be dependent on the skills of the user, adapted. Yes (without specification) Validity of the offer: 120 days from the date stated for receipt of tenders Desired deadline for written questions: 15.09.2014 Deadline for submitting offers Date: 09/24/2014


Address : SB CIME-GE, zu Hdn. von Professor CÉcile HÉbert, MXC 132 (BÂtiment MXC) - Station 12, 1015 Lausanne

Country :Switzerland

Email :

Tender notice number : 830937

Notice type : Tender Notice

Open date : 2014-09-24

Tender documents : T23445154.html

For more stories covering the world of technology, please see HispanicBusiness' Tech Channel

Source: TendersInfo (India)

Story Tools Facebook Linkedin Twitter RSS Feed Email Alerts & Newsletters