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Research Data from Peking University Update Understanding of Sensor Research (A betavoltaic microcell based on Au/s-SWCNTs/Ti Schottky junction)

August 19, 2014

By a News Reporter-Staff News Editor at Journal of Technology -- Fresh data on Sensor Research are presented in a new report. According to news originating from Beijing, People's Republic of China, by VerticalNews correspondents, research stated, "This paper reports a new type betavoltaic (BV) microcell based on intrinsic p-type semiconductive single-walled carbon nanotubes (s-SWCNTs)."

Our news journalists obtained a quote from the research from Peking University, "Our device composes of Au and Ti asymmetrical electrode pairs with s-SWCNTs laid over them forming Schottky junction with Ti and ohmic contact with Au. SWCNT bundles were self-assembled between Au and Ti electrodes by Dieletrophoretic (DEP) technique, and metallic SWCNTs (m-SWCNTs) were selectively eliminated by current-induced electrical breakdown method. 3.3 mCi/cm(2) thin-film radioisotope Ni-63 serves as beta particles source, with 100-year half-time and low toxicity."

According to the news editors, the research concluded: "Test results show that SWCNTs BV microcell has the open circuit voltage (V-OC) of 26 mV, short circuit current density (J(SC)) of 2.19 mu A/cm(2) and energy conversion efficiency (eta) of 5.20%."

For more information on this research see: A betavoltaic microcell based on Au/s-SWCNTs/Ti Schottky junction. Sensors and Actuators A-Physical, 2014;215():17-21. Sensors and Actuators A-Physical can be contacted at: Elsevier Science Sa, PO Box 564, 1001 Lausanne, Switzerland.

The news correspondents report that additional information may be obtained from Y.Y. Chang, Peking University, Inst Microelect, Natl Key Lab Micro Nanometer Fabricat Technol, Beijing 100871, People's Republic of China. Additional authors for this research include C.C. Chen, P. Liu and J.W. Zhang.

Keywords for this news article include: Asia, Beijing, Sensor Research, People's Republic of China

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Source: Journal of Technology

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