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Advanced Micro Devices Assigned Patent for Semiconductor Device Temperature Monitoring

August 12, 2014

By Targeted News Service

ALEXANDRIA, Va., Aug. 12 -- Advanced Micro Devices, Sunnyvale, California, has been assigned a patent (8,796,807) developed by four co-inventors for "[t]emperature monitoring in a semiconductor device by using a PN junction based on silicon/germanium materials." The co-inventors are Anthony Mowry, Buda, Texas, Rolf Stephan, Dresden, Germany, Markus Forsberg, Dresden, Germany, and Gert Burbach, Dresden, Germany.

The patent application was filed on Oct. 3, 2011 (13/251,532). The full-text of the patent can be found at

Written by Jude Bautista, edited by Vessie Ann Abalos.

30BautistaJude 140812-1046683

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Source: Targeted News Service

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