News Column

Advanced Micro Devices Assigned Patent for Semiconductor Device Temperature Monitoring

August 12, 2014



By Targeted News Service

ALEXANDRIA, Va., Aug. 12 -- Advanced Micro Devices, Sunnyvale, California, has been assigned a patent (8,796,807) developed by four co-inventors for "[t]emperature monitoring in a semiconductor device by using a PN junction based on silicon/germanium materials." The co-inventors are Anthony Mowry, Buda, Texas, Rolf Stephan, Dresden, Germany, Markus Forsberg, Dresden, Germany, and Gert Burbach, Dresden, Germany.

The patent application was filed on Oct. 3, 2011 (13/251,532). The full-text of the patent can be found at http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50&s1=8796807.PN.&OS=PN/8796807&RS=PN/8796807

Written by Jude Bautista, edited by Vessie Ann Abalos.

30BautistaJude 140812-1046683


For more stories covering the world of technology, please see HispanicBusiness' Tech Channel



Source: Targeted News Service


Story Tools






HispanicBusiness.com Facebook Linkedin Twitter RSS Feed Email Alerts & Newsletters