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Technical University Reports Findings in Advanced Material Research (Structural and Multiferroic Characteristics of Nanocomposite Ba0.5Sr0.5TiO3-Bi0.

July 15, 2014



Technical University Reports Findings in Advanced Material Research (Structural and Multiferroic Characteristics of Nanocomposite Ba0.5Sr0.5TiO3-Bi0.9La0.1Fe0.9Mn0.1O3 Thin Film Heterostructures)

By a News Reporter-Staff News Editor at Journal of Technology -- A new study on Advanced Material Research is now available. According to news reporting out of Punjab, India, by VerticalNews editors, research stated, "Multiferroic Ba0.5Sr0.5TiO3/Bi0.9La0.1Fe0.9Mn0.1O3 (BST/BLFM) thin film heterostructures with variable BST to BLFM thickness ratios were directly deposited on p-type Si(100) substrate by a chemical solution deposition method. The X-ray diffraction study revealed that the orientation of BLFM thin films could be varied with the thickness ratio."

Our news journalists obtained a quote from the research from Technical University, "The thin film heterostructures exhibited low leakage current, large grain size and uniform morphology. The Schottky emission behavior was found to be predominant mechanism for the leakage current. The maximum remanent polarization (P-r = 42.3 mu C/cm(2)) was achieved for the heterostructures with thickness ratio of 2.65. The dielectric tunability showed significant tuning response as a function of the thickness ratio and electric field. The BST buffer layer led to increased saturation magnetization (M-s = 28.6 emu/cm(3)) in BLFM films, which was about 90% larger than that of the M-s value of single layer BLFM films."

According to the news editors, the research concluded: "This result was attributed to the interface ferromagnetic exchange interaction that was confirmed by magnetoelectric measurements."

For more information on this research see: Structural and Multiferroic Characteristics of Nanocomposite Ba0.5Sr0.5TiO3-Bi0.9La0.1Fe0.9Mn0.1O3 Thin Film Heterostructures. Science of Advanced Materials, 2014;6(5):1043-1051. Science of Advanced Materials can be contacted at: Amer Scientific Publishers, 26650 The Old Rd, Ste 208, Valencia, CA 91381-0751, USA. (American Scientific Publishers - www.aspbs.com/)

Our news journalists report that additional information may be obtained by contacting V.A. Reddy, Giani Zail Singh Punjab Technical Univ Campus, Dept. of Appl Phys, Mat Sci Lab, Bathinda 151001, Punjab, India. Additional authors for this research include N. Dabra, J.S. Hundal, N.P. Pathak and R. Nath.

Keywords for this news article include: Asia, India, Punjab, Advanced Material Research

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Source: Journal of Technology


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