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Researchers Submit Patent Application, "High Speed Digital Transient Waveform Detection System and Method for Use in an Intelligent Electronic...

July 16, 2014



Researchers Submit Patent Application, "High Speed Digital Transient Waveform Detection System and Method for Use in an Intelligent Electronic Device", for Approval

By a News Reporter-Staff News Editor at Electronics Newsweekly -- From Washington, D.C., VerticalNews journalists report that a patent application by the inventors Spanier, Joseph (Brooklyn, NY); Zhu, Hai (Westbury, NY); Wang, Wei (Mahwah, NJ), filed on March 3, 2014, was made available online on July 3, 2014.

The patent's assignee is Electro Industries/Gauge Tech.

News editors obtained the following quote from the background information supplied by the inventors: "The present disclosure relates generally to the measurement of A.C. power systems, and more particularly, to an ultra high speed and flexible transient waveform detection system for use in an intelligent electronic device (IED).

"Transients are rapid changes in steady state conditions for voltages and currents. Transients can occur in all A.C. power systems. Transients designate a phenomenon or a quantity that varies between two consecutive time states at a shorter time waveform sample period than the measured waveform sample period of interest. If a voltage transient exceeds a voltage dip and/or a voltage swell threshold, the transient will be recorded as a voltage dip or swell. Various conditions such as weather conditions, lightning strikes, power surges and swells, blackouts, brownouts, and fault conditions can severely compromise power quality monitoring capabilities by IEDs.

"Based on the foregoing, it is therefore desirable to have a flexible, high-speed, transient waveform detection system for use in an intelligent electronic device."

As a supplement to the background information on this patent application, VerticalNews correspondents also obtained the inventors' summary information for this patent application: "The present disclosure provides a transient waveform detection system and a method for use in an intelligent electronic device (IED). As will be described, the transient waveform detection system is configured to test the power quality and usage at any metered point within a power distribution system. The system finds particular, but not exclusive, application in the ultra high speed detection and capture of transients.

"In an embodiment, the transient waveform detection system detects and measures transients on voltage input channels of the IED, which are coupled to by a power distribution system, while avoiding the introduction of crosstalk from waveform capture and revenue measurement circuits. Beneficially, the transient waveform detection system provides faster and more sensitive measurement of the transients than conventional systems and also provides system output data to better analyze the detected transients. The system also flexibly allows a user to set threshold levels for detecting transients for the input voltages.

"In some embodiments, the transient waveform detection system may detect transients on a plurality of input voltage channels using either phase to phase measurements or phase to neutral measurements.

"In one embodiment, the transient waveform detection system includes a field programmable gate array (FPGA) for use as a controller for controlling a transient detector. The FPGA includes a state machine for determining the state of a sampled signal with respect to a threshold level at a specified waveform sample period. The transient detector is configured to capture and measure the duration of a detected signal to determine whether the captured signal is in fact a transient signal, based on its amplitude. The duration data may also be utilized for analysis purposes.

"In one embodiment, the transient waveform detection system is incorporated into the body of an intelligent electronic device (IED 10) and includes, inter alia, a plurality of analog to digital circuits (A/D), a transient detector, a state machine, comparator circuitry and a multiplexer/subtractor circuit. In an embodiment, the transient detector, state machine, comparator circuitry, and multiplexer/subtractor circuit are incorporated into a field programmable gate array configured to receive digital samples of captured transients obtained from the analog to digital circuits (A/D).

"The transient detector further includes comparator circuitry for comparing transient values as well as threshold values; latch circuitry for storing peak transient values; at least one duration counter for storing duration values of the identified peak transient values; at least one storage device for storing and outputting transient data. The comparator circuitry determines whether a transient is a positive or a negative going transient, dependent upon pre-set positive and negative threshold values. The transient waveform detection system further includes additional FPGA 80 functionality for communicating data between the A/D converters and at least one DSP processor or a CPU besides the transient processing circuitry.

"According to a further aspect of the present disclosure, a method for detecting transients in input voltage channels is provided, the steps including: a) receiving a plurality of transient samples from said input analog voltage waveform in successive waveform sample periods; b) comparing a currently received transient sample with a previously latched input transient sample in each of said waveform sample periods; c) determining if the currently received transient sample is greater than the previously latched input transient sample in each of said waveform sample periods; d) overwriting the previously latched input transient sample with the current transient sample in the case where said determining step is satisfied in each of said waveform sample periods; e) identifying a peak transient corresponding to the currently latched input transient at the end of each of said waveform sample periods.

BRIEF DESCRIPTION OF THE DRAWINGS

"FIG. 1 is an overall block diagram of an IED system of the present disclosure, according to one embodiment.

"FIG. 2 is a block diagram of a circuit illustrating how front end voltage input channels are distributed to dedicated circuit paths: a transient detection, waveform capture path, and billing measurement path, to be scaled for processing by particular IED applications in accordance with one embodiment of the present disclosure.

"FIG. 3a illustrates an overall block diagram of the transient waveform detection system of the present disclosure, according to one embodiment.

"FIG. 3b illustrates an exemplary sampled waveform processed in accordance with waveform sample periods, according to one embodiment.

"FIG. 4a is a hardware configuration of a transient detector of the FPGA, according to one embodiment.

"FIG. 4b is a hardware configuration of a transient detector of the FPGA, according to another embodiment.

"FIG. 5 illustrates the operation of the transient detector and in particular the state machine's different states based upon the transient samples and threshold levels received by the IED.

"FIG. 6(a)-6(f) are graphs for illustrating the transient detector of transients at various states of the state machine of FIG. 4."

For additional information on this patent application, see: Spanier, Joseph; Zhu, Hai; Wang, Wei. High Speed Digital Transient Waveform Detection System and Method for Use in an Intelligent Electronic Device. Filed March 3, 2014 and posted July 3, 2014. Patent URL: http://appft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&u=%2Fnetahtml%2FPTO%2Fsearch-adv.html&r=5920&p=119&f=G&l=50&d=PG01&S1=20140626.PD.&OS=PD/20140626&RS=PD/20140626

Keywords for this news article include: Electronics, Digital Circuits, Electro Industries/Gauge Tech..

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Source: Electronics Newsweekly


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