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New Findings on Optoelectronics Described by Investigators at Technical University (A non-destructive approach for fast evaluation of elastic shear...

August 6, 2014



New Findings on Optoelectronics Described by Investigators at Technical University (A non-destructive approach for fast evaluation of elastic shear properties of marble slabs)

By a News Reporter-Staff News Editor at Electronics Newsweekly -- Current study results on Optoelectronics have been published. According to news originating from Munich, Germany, by VerticalNews editors, the research stated, "A comprehensive quality control of individual marble slabs within a charge used for construction purposes includes the knowledge of torsional moduli of elasticity for both orthogonal directions of slab's major surfaces. Appropriate measurement methods of the state of technology allow a reliable determination of this moduli on slabs exclusively in a destructive manner, thus only statistic statements from a strongly limited number of specimens within a charge are possible."

Our news journalists obtained a quote from the research from Technical University, "Several damage cases have shown that such statistic statements may be insufficient. This paper introduces an eigenfrequency method which has to be applied on a measurement system with a Laser Doppler Vibrometer (LDV), in order to quickly calculate a reliable range of torsional moduli of elasticity from an oscillation transient obtained by non-destructive operation of the LDV measurement system on a marble slab."

According to the news editors, the research concluded: "Results and advantages of the method are compared and discussed with respect to a widely used method based on ultrasonic shear waves."

For more information on this research see: A non-destructive approach for fast evaluation of elastic shear properties of marble slabs. Journal of Optoelectronics and Advanced Materials, 2014;16(5-6):634-639. Journal of Optoelectronics and Advanced Materials can be contacted at: Natl Inst Optoelectronics, 1 Atomistilor St, PO Box Mg-5, Bucharest-Magurele 76900, Romania.

The news correspondents report that additional information may be obtained from M. Gianni, Technical University of Munich, Inst Measurement Syst & Sensor Technol, D-80333 Munich, Germany.

Keywords for this news article include: Munich, Europe, Germany, Optoelectronics

Our reports deliver fact-based news of research and discoveries from around the world. Copyright 2014, NewsRx LLC


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Source: Electronics Newsweekly


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