News Column

"Driving Circuit Having Built-In-Self-Test Function" in Patent Application Approval Process

August 6, 2014



By a News Reporter-Staff News Editor at Electronics Newsweekly -- A patent application by the inventors Huang, Chih-Chuan (Kaohsiung City, TW); Tso, Ko-Yang (New Taipei City, TW), filed on January 16, 2014, was made available online on July 24, 2014, according to news reporting originating from Washington, D.C., by VerticalNews correspondents.

This patent application is assigned to Raydium Semiconductor Corporation.

The following quote was obtained by the news editors from the background information supplied by the inventors: "The present invention generally relates to a driving circuit having a built-in-self-test function; particularly, the present invention relates to a source driving circuit which has a judgment mechanism and can increase a driving efficiency.

"Generally, a source driving circuit of a display module utilizes an additional test module to test the accuracy of an output voltage. For instance, the test module includes a plurality of test pins, and the test module has a highly-accurate voltage value to determine pass or fail in the output voltage of the driving circuit.

"In practical applications, in order to get accurate voltage values, the driving circuit requires enough time to settle in each pixel period, and the settling time depends on a loading level of the output end of the circuit. In addition, when the circuit finishes the settling operation, the test module requires enough time for computing. In other words, the driving circuit requires enough settling time and computing time to execute settling and computing sequentially; however, it yet decreases the test efficiency of the test circuit.

"It is noted that the amount of the test pins of the test module is almost (or at least) one thousand pins, and the accurate value of the voltage must be less than 1 mV. However, more pins indicate more material cost of the driving circuit; in addition, the highly-accurate value of the output voltage depends on the performance of the test circuit. A larger amount of pins invisibly increase the hardware cost of the test circuit and the loading of the test time.

"For the above reasons, it is desired to design a display driving circuit for decreasing the test time and increasing the voltage accuracy."

In addition to the background information obtained for this patent application, VerticalNews journalists also obtained the inventors' summary information for this patent application: "In view of prior art, the present invention provides a driving circuit which has a judgment mechanism and is capable of increasing efficiency.

"It is an object of the present invention to provide a driving circuit which can execute built-in-self-test (GIST) to determine the accuracy of the voltage.

"It is another object of the present invention to provide a driving circuit which has a digital judgment mechanism to save the test time.

"It is another object of the present invention to provide a driving circuit which utilizes a hysteresis comparator, wherein the hysteresis comparator can adjust an offset voltage to control the offset voltage.

"The present invention provides a driving circuit which is provided for connecting with a display module. The driving circuit includes at least one reference voltage, at least one offset unit, and at least one buffer module. The at least one reference voltage source generates a reference voltage, and the at least one offset unit generates an offset voltage, wherein the offset voltage and the reference voltage form a judging voltage range. The at least one buffer module has a first input end, a second input end, and an output end, wherein the first input end receives an analog voltage; the at least one reference voltage source is connected with the second input end; the at least one buffer module, according as whether the analog voltage is within the judging voltage range, outputs a pass logic signal or a fail logic signal at the output end.

"It is noted that the buffer module includes a digital judgment unit, wherein the digital judgment unit receives the analog voltage and the judging voltage range and, according as whether the analog voltage is within the judging voltage range, selectively outputs a plurality of digital signals, wherein the digital signals include the pass logic signal and the fail logic signal.

"Compared to prior arts, the driving circuit of the present invention utilizes the buffer module to determine the accuracy of the analog voltage and, according as whether the analog voltage is within the judging voltage range, execute the digital logic test. Furthermore, the buffer module is a digital judgment buffer module and can determine the accuracy of the voltage by the digital logic mechanism so as to greatly decrease the test time. In addition, the driving circuit of the present invention is a BIST (Built-In-Self-Test) circuit which can directly execute the test in the original module (the driving circuit) without utilizing additional test apparatus so as to decrease the cost of the hardware.

"The detailed descriptions and the drawings thereof below provide further understanding about the advantage and the spirit of the present invention.

BRIEF DESCRIPTION OF THE DRAWINGS

"So that the manner in which the above recited features of the present invention can be understood in detail, a more particular description of the invention, briefly summarized above, may be had by reference to embodiments, some of which are illustrated in the appended drawings. It is to be noted, however, that the appended drawings illustrate only typical embodiments of this invention and are therefore not to be considered limiting of its scope, for the invention may admit to other equally effective embodiments.

"FIG. 1 is a schematic view of an embodiment of a driving circuit of the present invention;

"FIG. 2 is a schematic view of an embodiment of the present invention;

"FIG. 3A is a schematic view of a conventional judgment mechanism;

"FIG. 3B is a schematic view of an embodiment of the digital judgment mechanism of the present invention;

"FIG. 3C is a schematic view of another embodiment of the digital judgment mechanism of the present invention;

"FIG. 4 is a schematic view of another embodiment of the buffer module of the present invention;

"FIG. 5A is a schematic view of another embodiment of the buffer module of the present invention;

"FIG. 5B is a curve diagram of the voltage versus the voltage number;

"FIG. 6 is a schematic view of another embodiment of the driving circuit of the present invention;

"FIG. 7A is a schematic view of another embodiment of the driving circuit of the present invention; and

"FIG. 7B is a schematic view of another embodiment of the driving circuit of the present invention."

URL and more information on this patent application, see: Huang, Chih-Chuan; Tso, Ko-Yang. Driving Circuit Having Built-In-Self-Test Function. Filed January 16, 2014 and posted July 24, 2014. Patent URL: http://appft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&u=%2Fnetahtml%2FPTO%2Fsearch-adv.html&r=4010&p=81&f=G&l=50&d=PG01&S1=20140717.PD.&OS=PD/20140717&RS=PD/20140717

Keywords for this news article include: Electronics, Raydium Semiconductor Corporation.

Our reports deliver fact-based news of research and discoveries from around the world. Copyright 2014, NewsRx LLC


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Source: Electronics Newsweekly


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