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Studies Conducted by B. Haas et al on Crystal Research Recently Reported [Microstructural Characterization of Organic Heterostructures by...

July 8, 2014



Studies Conducted by B. Haas et al on Crystal Research Recently Reported [Microstructural Characterization of Organic Heterostructures by (Transmission) Electron Microscopy]

By a News Reporter-Staff News Editor at Journal of Technology -- Research findings on Crystal Research are discussed in a new report. According to news originating from Berlin, Germany, by VerticalNews correspondents, research stated, "Transmission electron microscopy can be a powerful tool to characterize organic heterostructures, if suitable methods are applied. Here, we present with the example of codeposited films of pentacene (PEN) and perfluoropentacene (PFP) different techniques, which can also be applied to the radiation-sensitive organic materials."

Our news journalists obtained a quote from the research, "The structure and morphology of codeposited films of PEN and PFP on a KCl(100) substrate have been investigated by different (transmission) electron microscopy techniques. When prepared by stoichiometrically equivalent coevaporation of both compounds, the films exhibit an intermixed phase that consists of a 1:1 mixture of the two molecules. Unavoidable excess of one of the two molecules was shown to lead to a spread-out film consisting of the respective molecule, which was verified for the case of PEN excess and whose growth was shown in detail. Interestingly, the film of segregated PEN exhibits a distinctly distinguishable growth from the pure PEN on the same substrate material, forming a 4-fold symmetry aligned with the KCl < 001 > directions."

According to the news editors, the research concluded: "The adaption of an automated nanocrystal orientation and phase mapping technique for the transmission electron microscope, commercially available as the so-called ASTAR system, to these beam-sensitive materials will be discussed as this method not only offers additional functionality for the nanoscale characterization of the films but is inherently advantageous for materials that are prone to beam-induced structural changes."

For more information on this research see: Microstructural Characterization of Organic Heterostructures by (Transmission) Electron Microscopy. Crystal Growth & Design, 2014;14(6):3010-3014. Crystal Growth & Design can be contacted at: Amer Chemical Soc, 1155 16TH St, NW, Washington, DC 20036, USA. (American Chemical Society - www.acs.org; Crystal Growth & Design - www.pubs.acs.org/journal/cgdefu)

The news correspondents report that additional information may be obtained from B. Haas, Bundesanstalt Mat Forsch & Prufung, D-12205 Berlin, Germany. Additional authors for this research include K.I. Gries, T. Breuer, I. Hausler, G. Witte and K. Volz.

Keywords for this news article include: Berlin, Europe, Germany, Crystal Research

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Source: Journal of Technology


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