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Researchers at Oak Ridge National Laboratory Release New Data on Microscopy and Microanalysis (Aberration-corrected X-ray spectrum imaging and...

July 8, 2014



Researchers at Oak Ridge National Laboratory Release New Data on Microscopy and Microanalysis (Aberration-corrected X-ray spectrum imaging and Fresnel contrast to differentiate nanoclusters and cavities in helium-irradiated alloy 14YWT)

By a News Reporter-Staff News Editor at Journal of Technology -- Investigators discuss new findings in Microscopy and Microanalysis. According to news reporting originating from Oak Ridge, Tennessee, by VerticalNews correspondents, research stated, "Helium accumulation negatively impacts structural materials used in neutron-irradiated environments, such as fission and fusion reactors. Next-generation fission and fusion reactors will require structural materials, such as steels, that are resistant to large neutron doses yet see service temperatures in the range most affected by helium embrittlement."

Our news editors obtained a quote from the research from Oak Ridge National Laboratory, "Previous work has indicated the difficulty of experimentally differentiating nanometer-sized cavities such as helium bubbles from the Ti-Y-O rich nanoclusters (NCs) in radiation-tolerant nanostructured ferritic alloys (NFAs). Because the NCs are expected to sequester helium away from grain boundaries and reduce embrittlement, experimental methods to study simultaneously the NC and bubble populations are needed. In this study, aberration-corrected scanning transmission electron microscopy (STEM) results combining high-collection-efficiency X-ray spectrum images (SIs), multivariate statistical analysis (MVSA), and Fresnel-contrast bright-field STEM imaging, have been used for such a purpose. Fresnel-contrast imaging, with careful attention to TEM-STEM reciprocity, differentiates bubbles from NCs. MVSA of X-ray SIs unambiguously identifies NCs."

According to the news editors, the research concluded: "Therefore, combined Fresnel-contrast STEM and X-ray SI is an effective STEM-based method to characterize helium-bearing NFAs."

For more information on this research see: Aberration-corrected X-ray spectrum imaging and Fresnel contrast to differentiate nanoclusters and cavities in helium-irradiated alloy 14YWT. Microscopy and Microanalysis, 2014;20(2):613-26. (Cambridge University Press - www.cambridge.org; Microscopy and Microanalysis - journals.cambridge.org/action/displayJournal?jid=MAM)

The news editors report that additional information may be obtained by contacting C.M. Parish, Oak Ridge National Laboratory, Materials Science and Technology Division, Oak Ridge, TN 37831, United States.

Keywords for this news article include: Oak Ridge, Tennessee, United States, North and Central America, Microscopy and Microanalysis.

Our reports deliver fact-based news of research and discoveries from around the world. Copyright 2014, NewsRx LLC


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Source: Journal of Technology


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