New Microwave and Wireless Technologies Data Have Been Reported by Researchers at Technical University (RF-MEMS variable matching networks and switches for multi-band and multi-mode GaN power amplifiers)
By a News Reporter-Staff News Editor at Journal of Technology -- Fresh data on Microwave and Wireless Technologies are presented in a new report. According to news originating from Munich, Germany, by VerticalNews correspondents, research stated, "This work presents radio-frequency-microelectromechanical-system (RF-MEMS)-based tunable matching networks for a multi-band gallium nitride (GaN) power amplifer (PA) application. In the frequency range from 3.5-8.5GHz return losses of 5-10dB were measured for the input network, matching impedances close to the border of the Smith chart."
Our news journalists obtained a quote from the research from Technical University, "For the output matching network return losses of 10-20dB and insertion losses of 1.3-2dB were measured. The matching networks can tune the PA to four different operating frequencies, as well as changing the transistor's mode of operation from maximum delivered-output-power to maximum power-added-efficiency (PAE), while keeping the operating frequency constant."
According to the news editors, the research concluded: "Furthermore, different single pole double throw (SPDT)-switches are designed and characterized, to be used in frequency-agile transmit/receive-modules (T/R modules)."
For more information on this research see: RF-MEMS variable matching networks and switches for multi-band and multi-mode GaN power amplifiers. International Journal of Microwave and Wireless Technologies, 2014;6(3-4):265-276. International Journal of Microwave and Wireless Technologies can be contacted at: Cambridge Univ Press, Edinburgh Bldg, Shaftesbury Rd, CB2 8RU Cambridge, England. (Cambridge University Press - www.cambridge.org; International Journal of Microwave and Wireless Technologies - journals.cambridge.org/action/displayJournal?jid=MRF)
The news correspondents report that additional information may be obtained from S.A. Figur, Technical University of Munich, Lehrstuhl Hochfrequenztech, D-80290 Munich, Germany. Additional authors for this research include F. van Raay, R. Quay, P. Lohmiller, L. Vietzorreck and V. Ziegler.
Keywords for this news article include: Munich, Europe, Germany, Microwave and Wireless Technologies
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