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Scanning electron microscopy-based Kathodolumineszenz Mikroskop

June 9, 2014



Tenders are invited for Scanning electron microscopy-based Kathodolumineszenz Mikroskop The Swiss Federal Institute of Technology Lausanne (EPFL) is planning to purchase one based on scanning electron microscopy Kathodolumineszenzmikroskops. The device is in the Interdisciplinary Center for Electron Microscopy (CIME) installed to allow luminescence spectroscopy. The device is used for state-of-the-art materials research, to investigate, in particular (structural) defects in materials and their optical and electronic properties over a wide spectral range from UV to near infrared. The requirements of the EPFL and the specific objectives of the scientifc CIME be taking into account, focus on spectroscopic investigations with the aid of cathodoluminescence set (KL): over a wide temperature range from 400K to 10K of structural defects and dislocations in crystals with respect to optical properties of semiconductor nanostructures Optical properties of metallic nanostructures Validity of the offer: 120 days from the date stated for receipt of tenders Desired deadline for written questions: 30.06.2014 Deadline for submitting offers Date: 09/07/2014

Major organization : ECOLE POLYTECHNIQUE FÉDÉRALE DE LAUSANNE (EPFL)

Address : Laboratory of Semiconductor Materials (LMSC), zu Hdn. von Professor A. Fontcuberta i Morral, BÂtiment MXC - Station 12, 1015 Lausanne

Country :Switzerland

Email : jerome.butty@epfl.ch

Tender notice number : 823289

Notice type : Tender Notice

Open date : 2014-07-09



Tender documents : T22539945.html


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Source: TendersInfo (India)


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