News Column

"Harmonic Ratio Based Defect Classifier" in Patent Application Approval Process

June 12, 2014



By a News Reporter-Staff News Editor at Politics & Government Week -- A patent application by the inventors Dziak, Scott M. (Fort Collins, CO); Jin, Ming (Fremont, CA); Dykhuis, Jonathan (Firestone, CO), filed on November 19, 2012, was made available online on May 29, 2014, according to news reporting originating from Washington, D.C., by VerticalNews correspondents.

This patent application is assigned to Lsi Corporation.

The following quote was obtained by the news editors from the background information supplied by the inventors: "Data can be stored on several types of carrier media, such as hard disk drives, optical disks, and other forms of permanent or semi-permanent storage. Defects in carrier media result in unreliable behavior, poor performance, or data corruption. Testing for media defects can improve reliability in data storage systems."

In addition to the background information obtained for this patent application, VerticalNews journalists also obtained the inventors' summary information for this patent application: "An embodiment of the disclosure is a method of detecting and classifying at least one media defect. A periodic pattern is written to a medium to yield at least one waveform. The magnitude of the waveform is compared against a defect threshold to detect the presence or absence of media defects in the medium. When at least one defect is detected, a magnitude for each of at least two harmonics of the waveform is determined in the defect range. The magnitudes of the at least two harmonics are utilized to classify the defect.

"It is to be understood that both the foregoing general description and the following detailed description are not necessarily restrictive of the disclosure. The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments of the disclosure.

BRIEF DESCRIPTION OF THE DRAWINGS

"The embodiments of the disclosure may be better understood by those skilled in the art by reference to the accompanying figures in which:

"FIG. 1A is a block diagram illustrating a system for detecting and classifying at least one media defect, in accordance with an embodiment of the disclosure;

"FIG. 1B is a graphical illustration of a waveform generated by writing a periodic pattern to a medium, in accordance with an embodiment of the disclosure;

"FIG. 1C is a graphical illustration of a ratio of magnitudes of at least two harmonics of the at least one waveform compared to a classification threshold, in accordance with an embodiment of the disclosure;

"FIG. 2 is a flow diagram illustrating a method of detecting and classifying at least one media defect, in accordance with an embodiment of the disclosure; and

"FIG. 3 is a flow diagram illustrating a method of detecting and classifying at least one media defect, in accordance with an embodiment of the disclosure."

URL and more information on this patent application, see: Dziak, Scott M.; Jin, Ming; Dykhuis, Jonathan. Harmonic Ratio Based Defect Classifier. Filed November 19, 2012 and posted May 29, 2014. Patent URL: http://appft.uspto.gov/netacgi/nph-Parser?Sect1=PTO2&Sect2=HITOFF&u=%2Fnetahtml%2FPTO%2Fsearch-adv.html&r=3742&p=75&f=G&l=50&d=PG01&S1=20140522.PD.&OS=PD/20140522&RS=PD/20140522

Keywords for this news article include: Lsi Corporation.

Our reports deliver fact-based news of research and discoveries from around the world. Copyright 2014, NewsRx LLC


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Source: Politics & Government Week


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