Report Summarizes Zinc Compounds Study Findings from Ohio University (Multiple oscillator models for the optical constants of polycrystalline zinc oxide thin films over a wide wavelength range)
By a News Reporter-Staff News Editor at Science Letter -- Data detailed on Zinc Compounds have been presented. According to news reporting originating in Athens, Ohio, by NewsRx journalists, research stated, "Zinc oxide (ZnO) films were prepared on Si(1 1 1) and quartz substrates using RF-magnetron sputtering in N2 plasma at room temperature. From the X-ray diffraction observations, it was found that all films are polycrystalline with a preferred orientation of (1 0 1)."
The news reporters obtained a quote from the research from Ohio University, "X ray photoelectron spectroscopy was used to analyze the chemical composition of the films by observing the behavior of the Zn2p3, Ols, N1 s, and Cl s lines. The thicknesses and optical constants of the ZnO thin films were determined using variable angle spectroscopic ellipsometry through the GenoscTM Herzinger-Johs parameterized semiconductor oscillator functions and multiple Gaussian oscillator models. Combining multiple oscillator types provided a very flexible approach to fitting optical constants over a wavelength range 190-1400 nm while simultaneously enforcing Kramers-Kronig consistency in the fitted ellipsometric parameters. Refractive indices of the films were determined to be in the range 1.68-1.93 and extinction coefficients in the range 4.56 10-6-0.23.A direct bandgap of 3.38 + 0.03 eV was calculated from the extinction coefficient. Low temperature photoluminescence studies of the films exhibited one prominent peak at 3.41 eV."
According to the news reporters, the research concluded: "The equality of the ZnO thin films was obtained through the depolarization measurements. ."
For more information on this research see: Multiple oscillator models for the optical constants of polycrystalline zinc oxide thin films over a wide wavelength range. Applied Surface Science, 2014;307():558-565. Applied Surface Science can be contacted at: Elsevier Science Bv, PO Box 211, 1000 Ae Amsterdam, Netherlands. (Elsevier - www.elsevier.com; Applied Surface Science - www.elsevier.com/wps/product/cws_home/505669)
Our news correspondents report that additional information may be obtained by contacting J.M. Khoshman, Ohio University, Dept. of Phys & Astron, Athens, OH 45701, United States. Additional authors for this research include J.N. Hilfiker, N. Tabet and M.E. Kordesch (see also Zinc Compounds).
Keywords for this news article include: Ohio, Athens, Chemicals, Chemistry, Zinc Oxide, United States, Nanotechnology, Zinc Compounds, North and Central America
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