News Column

Researchers from Chiba University Provide Details of New Studies and Findings in the Area of Materials Science

June 27, 2014

By a News Reporter-Staff News Editor at Science Letter -- Investigators publish new report on Science. According to news reporting out of Chiba, Japan, by NewsRx editors, research stated, "In recent years, organic flexible devices have been investigated extensively and sub-millimeter bending stability of organic thin film devices has been achieved by placing the active layer of the transistor on a neutral strain surface. Around the neutral strain surface, an organic thin film has a high bending durability because the in-plane tensile and compressive strain cancel each other."

Our news journalists obtained a quote from the research from Chiba University, "However, this type of highly flexible device is also destroyed or undergoes irreversible degradation when subjected to hard bending, and the breaking point is very difficult to detect experimentally. Therefore, we performed a finite element analysis of a flexible device and found a possible breaking point at the boundary between the contact electrode and the organic layer. This was the result of a strain concentration at the boundary due to the difference in Young's modulus of the organic semiconductor and Au. In addition, the shear stress is concentrated around the edge of the Au electrode."

According to the news editors, the research concluded: "These results indicate that the most likely breaking point for this type of flexible transistor is a rupture of the organic layer at the interface with the Au electrode."

For more information on this research see: Mechanical analysis of organic flexible devices by finite element calculation. Physica Status Solidi A-Applications and Materials Science, 2014;211(4):795-799. Physica Status Solidi A-Applications and Materials Science can be contacted at: Wiley-V C H Verlag Gmbh, Boschstrasse 12, D-69469 Weinheim, Germany (see also Science).

Our news journalists report that additional information may be obtained by contacting M. Sakai, Chiba University, Dept. of Elect & Elect Engn, Inage Ku, Chiba 2638522, Japan. Additional authors for this research include Y. Yamazaki, S. Yamaguchi, J. Hayashi and K. Kudo.

Keywords for this news article include: Asia, Chiba, Japan, Science

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Source: Science Letter

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