News Column

Findings from University of Electronic Science and Technology Provides New Data on Materials Science

June 24, 2014

By a News Reporter-Staff News Editor at Journal of Technology -- Data detailed on Materials Science have been presented. According to news reporting originating in Chengdu, People's Republic of China, by VerticalNews journalists, research stated, "Highly epitaidal LaBaCo2O5.5+delta (LBCO) thin films were grown on different miscut (001) SrTiO3 substrates (miscut angle of 0.50 degrees, 3.0 degrees, and 5.0 degrees) to study the substrate surface step terrace effect on the in-plane electrical transport properties."

The news reporters obtained a quote from the research from the University of Electronic Science and Technology, "The microstructure studies by X-ray diffraction and transmission electron microscopy indicate that the as-grown films are A-site disordered cubic perovskite structures with the c-axis highly oriented along the film growth direction. The four-probe scanning tunneling microscopy (STM) studies show that the LBCO thin films grown on the vicinal SrTiO3 substrates have a typical semiconductor behavior with the substrate surface terrace step inducing anisotropic electronic transport properties."

According to the news reporters, the research concluded: "These results indicate that in highly epitaxial thin films the surface terrace step induced local strains can play an important role in controlling the electronic transport properties and the anisotropic nature."

For more information on this research see: Step Terrace Tuned Anisotropic Transport Properties of Highly Epitaxial LaBaCo2O5.5+delta Thin Films on Vicinal SrTiO3 Substrates. ACS Applied Materials & Interfaces, 2014;6(9):6704-6708. ACS Applied Materials & Interfaces can be contacted at: Amer Chemical Soc, 1155 16TH St, NW, Washington, DC 20036, USA. (American Chemical Society -; ACS Applied Materials & Interfaces -

Our news correspondents report that additional information may be obtained by contacting Q. Zou, Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devic, Chengdu 610054, Sichuan, People's Republic of China. Additional authors for this research include M. Liu, G.Q. Wang, H.L. Lu, T.Z. Yang, H.M. Guo, C.R. Ma, X. Xu, M.H. Zhang, J.C. Jiang, E.I. Meletis, Y. Lin, H.J. Gao and C.L. Chen.

Keywords for this news article include: Asia, Chengdu, Materials Science, People's Republic of China

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Source: Journal of Technology

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