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Recent Studies from Institute of High Energy Physics Add New Data to Crystallography

June 17, 2014

By a News Reporter-Staff News Editor at Journal of Technology -- Investigators publish new report on Crystallography. According to news originating from Beijing, People's Republic of China, by VerticalNews correspondents, research stated, "Recent experiments in serial femtosecond crystallography (SFX) have demonstrated the feasibility of obtaining structural information from nanoscale crystals using X-ray free-electron lasers (XFELs). However, millions of crystals are required to determine one reliable structure."

Our news journalists obtained a quote from the research from the Institute of High Energy Physics, "Here, an improved integration algorithm for SFX data processing is reported. By evaluating the dimensions of each crystal and correcting for the geometric factors of single patterns, the effective diffraction intensities, as opposed to the directly measured single-shot pattern diffraction intensities, can be merged to acquire more accurate integrated intensities which can be used for structure determination."

According to the news editors, the research concluded: "This improvement enhances the quality of electron-density maps and decreases the number of diffraction patterns that are needed to solve the crystal structure in SFX experiments."

For more information on this research see: An improved integration method in serial femtosecond crystallography. Acta Crystallographica Section D-Biological Crystallography, 2014;70():1202-1211. Acta Crystallographica Section D-Biological Crystallography can be contacted at: Wiley-Blackwell, 111 River St, Hoboken 07030-5774, NJ, USA.

The news correspondents report that additional information may be obtained from K. Qu, Chinese Academy Sci, Inst High Energy Phys, Beijing Synchrotron Radiat Facil, Beijing 100049, People's Republic of China. Additional authors for this research include L. Zhou and Y.H. Dong.

Keywords for this news article include: Asia, Beijing, Crystallography, People's Republic of China

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Source: Journal of Technology

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