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Researchers from University of Nantes Provide Details of New Studies and Findings in the Area of Sensor Research

May 13, 2014



By a News Reporter-Staff News Editor at Journal of Technology -- Investigators publish new report on Sensor Research. According to news reporting originating from Nantes, France, by VerticalNews correspondents, research stated, "Eddy current pulsed thermography (ECPT) is implemented for detection and separation of impact damage and resulting damages in carbon fiber reinforced plastic (CFRP) samples. Complexity and nonhomogeneity of fiber texture as well as multiple defects limit detection identification and characterization from transient images of the ECPT."

Our news editors obtained a quote from the research from the University of Nantes, "In this paper, an integration of principal component analysis (PCA) and independent component analysis (ICA) on transient thermal videos has been proposed. This method enables spatial and temporal patterns to be extracted according to the transient response behavior without any training knowledge. In the first step, using the PCA, the data is transformed to orthogonal principal component subspace and the dimension is reduced. Multichannel morphological component analysis, as an ICA method, is then implemented to deal with the sparse and independence property for detecting and separating the influences of different layers, defects, and their combination information in the CFRP."

According to the news editors, the research concluded: "Because different transient behaviors exist, multiple types of defects can be identified and separated by calculating the cross-correlation of the estimated mixing vectors between impact the ECPT sequences and nondefect ECPT sequences."

For more information on this research see: Impact Damage Detection and Identification Using Eddy Current Pulsed Thermography Through Integration of PCA and ICA. IEEE Sensors Journal, 2014;14(5):1655-1663. IEEE Sensors Journal can be contacted at: Ieee-Inst Electrical Electronics Engineers Inc, 445 Hoes Lane, Piscataway, NJ 08855-4141, USA. (Institute of Electrical and Electronics Engineers - www.ieee.org/; IEEE Sensors Journal - ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7361)

The news editors report that additional information may be obtained by contacting L. Cheng, Univ Nantes, Inst Res Elect Engn Nantes Atlantique, F-44300 Nantes, France. Additional authors for this research include B. Gao, G.Y. Tian, W.L. Woo and G. Berthiau.

Keywords for this news article include: Nantes, France, Europe, Sensor Research

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Source: Journal of Technology


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