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Findings from R. Swadzba and Co-Authors Provide New Insights into Materials Science

May 13, 2014

By a News Reporter-Staff News Editor at Journal of Technology -- Researchers detail new data in Materials Science. According to news originating from Bielsko Biala, Poland, by VerticalNews correspondents, research stated, "The study concerns electron beam physical deposition (EB-PVD) of yttria stabilized zirconia (YSZ) deposited on pre-oxidized Pt-modified aluminide bond coating. The coating was prepared by the means of Pt galvanizing followed by vapor phase aluminizing at 1050 degrees C. During annealing at 1100 degrees C in air atmosphere for 4h a 1 mu m thick layer of thermally grown oxide (TGO) consisting of equiaxed -alumina grains was formed."

Our news journalists obtained a quote from the research, "Focused ion beam and scanning/transmission electron microscopy analysis revealed the presence of nanoscale Cr-rich precipitates distributed in the TGO as well as Cr precipitation in the grain boundaries of the phase at the interface between the TGO and bond coat. Deposition of the YSZ on a pre-oxidized substrate provided mechanical keying with the TGO."

According to the news editors, the research concluded: "Void formation was observed at the TGO and bondcoat interface presumably due to initial transient alumina formation."

For more information on this research see: Microstructural examination of TGO formed during pre-oxidation on Pt-aluminized Ni-based superalloy. Materials and Corrosion-Werkstoffe Und Korrosion, 2014;65(3):319-323. Materials and Corrosion-Werkstoffe Und Korrosion can be contacted at: Wiley-V C H Verlag Gmbh, Boschstrasse 12, D-69469 Weinheim, Germany.

The news correspondents report that additional information may be obtained from R. Swadzba, AVIO Polska, Bielsko Biala, Poland. Additional authors for this research include J. Wiedermann, M. Hetmanczyk, L. Swadzba, B. Witala, G. Moskal, B. Mendala and L. Komendera.

Keywords for this news article include: Poland, Europe, Bielsko Biala, Materials Science

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Source: Journal of Technology

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