News Column

National Institute for Materials Science Details Findings in Transmission Electron Microscopy

June 6, 2014

By a News Reporter-Staff News Editor at Science Letter -- Investigators publish new report on Transmission Electron Microscopy. According to news reporting out of Ibaraki, Japan, by NewsRx editors, research stated, "The growth of metal oxide nanowires can proceed via a number of mechanisms such as screw dislocation, vapor-liquid-solid process, or seeded growth. Transmission electron microscopy (TEM) can resolve nanowires but invariably lacks the facility for direct observation of how nanowires form."

Our news journalists obtained a quote from the research from National Institute for Materials Science, "We used a transmission electron microscope equipped with an in situ heating stage to follow the growth of quaternary metal oxide nanowires. Video-rate imaging revealed barium carbonate nanoparticles diffusing through a porous matrix containing copper and yttrium oxides to subsequently act as catalytic sites for the outgrowth of Y2BaCuO5 nanowires on reaching the surface."

According to the news editors, the research concluded: "The results suggest that sites on the rough surface of the porous matrix act as microcrucibles and thus provide insights into the mechanisms that drive metal oxide nanowire growth at high temperatures."

For more information on this research see: In Situ TEM Observation of a Microcrucible Mechanism of Nanowire Growth. Science, 2014;344(6184):623-626. Science can be contacted at: Amer Assoc Advancement Science, 1200 New York Ave, NW, Washington, DC 20005, USA. (Springer -; Science -

Our news journalists report that additional information may be obtained by contacting R. Boston, Natl Inst Mat Sci, Tsukuba, Ibaraki 3050047, Japan. Additional authors for this research include Z. Schnepp, Y. Nemoto, Y. Sakka and S.R. Hall (see also Transmission Electron Microscopy).

Keywords for this news article include: Asia, Japan, Ibaraki, Nanowire, Nanotechnology, Emerging Technologies, Transmission Electron Microscopy

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Source: Science Letter

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