News Column

Findings on Sensor Research Described by N. Tadic and Colleagues

June 3, 2014

By a News Reporter-Staff News Editor at Journal of Technology -- Investigators publish new report on Sensor Research. According to news reporting originating in South Charleston, West Virginia, by VerticalNews journalists, research stated, "A CMOS controllable constant-power source for variable resistive loads is presented. Its operation is based on the resistive mirror which keeps the equality of the resistive original resistance and the resistive image resistance."

The news reporters obtained a quote from the research, "Stability requirements are in accordance with the requirements of the basic approach itself enabling large load resistance dynamic range. Two designs are considered. Prototypes based on discrete components have been experimentally verified. Relative errors of the generated power with the discrete values in the range from 0.48 to 10.8 mW, for the load resistance range from 0.5 to 1.5 k Omega, are smaller than 2.2%."

According to the news reporters, the research concluded: "Also, for the generated power of 6 mW, the load resistance range from 0.2 to 5.6 k Omega with the relative error smaller than 0.7% has been achieved."

For more information on this research see: A CMOS Controllable Constant-Power Source for Variable Resistive Loads Using Resistive Mirror With Large Load Resistance Dynamic Range. IEEE Sensors Journal, 2014;14(6):1988-1996. IEEE Sensors Journal can be contacted at: Ieee-Inst Electrical Electronics Engineers Inc, 445 Hoes Lane, Piscataway, NJ 08855-4141, USA. (Institute of Electrical and Electronics Engineers -; IEEE Sensors Journal -

Our news correspondents report that additional information may be obtained by contacting N. Tadic, Kanawha Valley Community & Technical College, S Charleston, WV 25112, United States. Additional authors for this research include M. Zogovic and D. Gobovic.

Keywords for this news article include: West Virginia, United States, Sensor Research, South Charleston, North and Central America

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Source: Journal of Technology

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