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Reports from University of Tartu Describe Recent Advances in Optical Research

February 11, 2014

By a News Reporter-Staff News Editor at Journal of Technology -- Current study results on Optical Research have been published. According to news reporting originating in Tartu, Estonia, by VerticalNews editors, the research stated, "The possibilities of simultaneous determining the thickness and optical constants of uniaxially anisotropic nanoscale dielectric films on absorbing isotropic substrates by ellipsometry, which is based only on the phase change measurements, are investigated."

The news reporters obtained a quote from the research from the University of Tartu, "By using analytical formulas for differential ellipsometric angles, obtained in the framework of a long-wavelength approximation, it is shown that in certain cases the correlation-free measurements of the material parameters and thickness of such films are entirely possible solely from phase information."

According to the news reporters, the research concluded: "The accuracy of the obtained formulas for determining the parameters of ultrathin films is estimated by computer simulation of the reflection problem on the basis of the exact electromagnetic theory for anisotropic layered systems."

For more information on this research see: Correlation-free ellipsometric characterization of uniaxially anisotropic nanolayers. Optik, 2014;125(1):489-494. Optik can be contacted at: Elsevier Gmbh, Urban & Fischer Verlag, Office Jena, P O Box 100537, 07705 Jena, Germany. (Elsevier -; Optik -

Our news correspondents report that additional information may be obtained by contacting P. Adamson, University of Tartu, Inst Phys, EE-51014 Tartu, Estonia.

Keywords for this news article include: Tartu, Europe, Estonia, Optical Research

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Source: Journal of Technology

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