The patent's inventors are Gillespie, Kevin M. (
This patent was filed on
From the background information supplied by the inventors, news correspondents obtained the following quote: "In the design of an integrated circuit device, it is typically useful to simulate functional modules of the device, prior to building physical device samples, in order to ensure that the device will operate in compliance with a specification. Modules, in turn, are assemblies of circuits, and each circuit is made up of physical components such as transistors.
"Models of circuits are used to simulate operation of the physical circuits. In the simulation process, it is desirable to determine the extent of potential variability in the operation of a circuit, so that variability in circuit operation can be accounted for in the design of an entire integrated circuit device.
"One method of determining the variability of a circuit includes simulating the operation of the circuit while randomly varying each of a number of component characteristics such as transistor threshold voltage, transistor channel length, and transistor channel width, for each transistor of the circuit. Such methods are known as
Supplementing the background information on this patent, VerticalNews reporters also obtained the inventors' summary information for this patent: "Methods are disclosed of determining a likelihood of failure of a circuit made in accordance with a circuit design due to certain variations. The circuit design preferably represents a module for inclusion in an integrated circuit device.
"Measurements are performed on previously fabricated components (or combinations of components) that are included in the circuit design. A plurality of variables are defined based on the measurements, each variable preferably having a mean and a standard deviation. A figure of merit that is dependent on the variables is defined for the circuit design. A failure criterion based on the figure of merit is also defined for the circuit design. A sensitivity of the figure of merit to each variable is determined by simulating operation of a circuit made in accordance with the circuit design based on a departure of each variable from its mean value. A plurality of normalized sensitivities of the figure of merit is determined using the sensitivity of the figure of merit to each variable. A simulation deviation for each variable is determined based on the normalized sensitivities and a predetermined maximum tolerable failure probability for a circuit made in accordance with the circuit design. A value of the figure of merit is determined using the plurality of simulation deviations. Using the determined value of the figure of merit and the failure criterion, a prediction is made whether a circuit made in accordance with the circuit design will fail."
For the URL and additional information on this patent, see: Gillespie, Kevin M.;
Keywords for this news article include:
Our reports deliver fact-based news of research and discoveries from around the world. Copyright 2014, NewsRx LLC
Most Popular Stories
- Koch Brothers Step up Anti-Obamacare Campaign
- FDIC Sues Big Banks Over Rate Manipulation
- Vybz Kartel Convicted of Murder
- FDIC Accuses Big Banks of Fraud, Conspiracy
- Stocks Close Lower Ahead of Crimea Vote
- U.S. Consumer Sentiment Falls in Early March
- Ulta Shares Look Good on Strong Q4
- Is Malaysian Airlines Flight 370 in Andaman Sea?
- Jittery Investors Dumping Russian Stocks
- SoCalGas Reaches Record Spend on Diversity Suppliers