LTE-Advanced is an evolutionary step in the continuing development of LTE. Appropriate test and measurement throughout the entire development lifecycle, however, remains critical to its successful proliferation. Agilent’s previously introduced LTE-Advanced signal analyzer and signal generation solutions, industry firsts, attacked this problem at the R&D stage. Now, Agilent’s embedded LTE-Advanced X-Series measurement application is addressing the test challenge during the design validation and manufacturing phases.
The new LTE-Advanced measurement application provides one-button measurements for Agilent’s X-Series and modular signal analyzers. With fast measurement speed, SCPI programmability, pass/fail testing and simplicity of operation, the application is ideally suited for design verification and manufacturing.
“Validating and manufacturing LTE-Advanced transmitters and components requires the industry’s best, most up-to-date solutions,” said
RF Conformance Testing Simplified
Agilent’s LTE-Advanced measurement application enables the industry’s most comprehensive RF conformance testing of both contiguous and non-contiguous configurations of LTE-Advanced transmitters as defined by the 3GPP Release 11 specification. Specific measurements supported include transmitter characteristics testing of output power, transmitted signal quality, and unwanted emissions of both base stations and user equipment.
Also supported in the measurement application is cumulative ACLR (CACLR) and cumulative spectrum emissions mask (SEM) measurements for intra-band non-contiguous carrier aggregation—a new requirement in 3GPP Release 11. The intra-band non-contiguous configuration introduces unique challenges to the unwanted emissions RF measurements because the spectrum within the sub-block gap can be deployed by another operator. The new CACLR requirement and unique special mask for SEM measurement measures the contributions from carriers on both sides of the sub-block gap. The new LTE-Advanced measurement application is the only solution on the market to provide both CACLR and a special mask for SEM for non-contiguous carrier aggregation.
X-Series Measurement Applications
X-Series measurement applications increase the capability and functionality of the
U.S. Pricing and Availability
The new LTE-Advanced X-Series measurement application for FDD and TDD is currently available through Agilent’s Early Access Program. The LTE-Advanced options on the N9080B and N9082B for benchtop products and the M9080B and M9082B for modular products are priced at
More information on the LTE-Advanced measurement application is available at www.agilent.com/find/LTEAdvApp. Images of the measurement application are available at www.agilent.com/find/LTEAdvApp_images.
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