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Research Conducted at University of Hyderabad Has Updated Our Knowledge about Vacuum Technology

February 25, 2014

By a News Reporter-Staff News Editor at Journal of Technology -- Investigators publish new report on Vacuum Technology. According to news originating from Andhra Pradesh, India, by VerticalNews correspondents, research stated, "Electrostatic potential variation across surface of a diamond/beta-SiC nanocomposite thin film is obtained using scanning Kelvin probe microscopy."

Our news journalists obtained a quote from the research from the University of Hyderabad, "An average electrostatic potential of similar to -120 mV is measured on the surface (5 x 5 mu m(2)) of the nanocomposite thin film. Using this value and the nominal work function of the probe, the work function values of the constituents could be estimated."

According to the news editors, the research concluded: "In conjunction with secondary electron surface micrograph, the surface potential map features are relevantly assigned to the respective constituents in the nanocomposite thin film."

For more information on this research see: Electrostatic potential variation across the surface of a diamond/beta-SiC nanocomposite thin film. Vacuum, 2014;101():333-336. Vacuum can be contacted at: Pergamon-Elsevier Science Ltd, The Boulevard, Langford Lane, Kidlington, Oxford OX5 1GB, England. (Elsevier -; Vacuum -

The news correspondents report that additional information may be obtained from M.K. Kuntumalla, University of Hyderabad, Sch Engn Sci & Technol, Hyderabad 500046, Andhra Pradesh, India.

Keywords for this news article include: Asia, India, Andhra Pradesh, Vacuum Technology

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Source: Journal of Technology

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