By a News Reporter-Staff News Editor at Electronics Newsweekly -- Investigators discuss new findings in Circuits and Signal Processing. According to news reporting originating from Minneapolis, Minnesota, by VerticalNews correspondents, research stated, "In orthogonal frequency division multiplexing (OFDM) systems, the impulse noise causes catastrophic accuracy degradation since the impulse noise affects all the subcarriers in a symbol due to the fast Fourier transform (FFT) operations at the receiver. Potential causes of impulse noise include erasure channel, power switching, and circuit failure in integrated circuits."
Our news editors obtained a quote from the research from the University of Minnesota, "In this paper, from a practical observation, a novel iterative impulse error correction scheme is proposed. This scheme is referred to as the impulse noise location and value search algorithm, which is based on the crucial observation of the relationship of the impulse noise and the symbol constellation. In a 512-FFT OFDM system at 25 dB additive white Gaussian noise signal-to-noise ratio, for quadrature amplitude modulation (QAM)-4 and QAM-8 modulation, simulation results show that our proposed novel scheme can effectively correct impulse errors that corrupt up to 20.7 % and 13.9 % of the received time-domain signal at known locations."
According to the news editors, the research concluded: "In addition, without the knowledge of impulse noise location, the proposed scheme still can correct at least 9.96 % of the received time-domain signal for QAM-4 modulation."
For more information on this research see: Impulse Noise Correction in OFDM Systems. Journal of Signal Processing Systems for Signal Image and Video Technology, 2014;74(2):245-262. Journal of Signal Processing Systems for Signal Image and Video Technology can be contacted at: Springer, 233 Spring St, New York, NY 10013, USA.
The news editors report that additional information may be obtained by contacting R.F. Liu, University of Minnesota, Dept. of Elect & Comp Engn, Minneapolis, MN 55455, United States. Additional authors for this research include T.L. Kung and K.K. Parhi.
Keywords for this news article include: Minnesota, Minneapolis, United States, North and Central America, Circuits and Signal Processing
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