By a News Reporter-Staff News Editor at Electronics Newsweekly -- Current study results on Nanocrystals have been published. According to news reporting originating from Chapel Hill, North Carolina, by VerticalNews correspondents, research stated, "Interfacial charge recombination dynamics in nanocrystalline SnO2 and TiO2 thin films sensitized with phosphonate-derivatized ruthenium chromophores (Ru-(bpy)(2)(4,4'-(PO3H2)(2)bpy)](2+), RuP) have been investigated in aqueous media by nanosecond transient absorption spectroscopy. Back electron transfer (BET) rates for RuP-SnO2 were observed to be 2-3 times greater than for RuP-TiO2."
Our news editors obtained a quote from the research from the University of North Carolina, "Additionally, rates of charge recombination for RuP-TiO2 show a significant pH dependence, while only a subtle influence of pH is observed for BET in RuP-SnO2. Cyclic voltammetry measurements indicate the exponential distribution of intra-band-gap trap states varies with pH for both SnO2 and TiO2 nanocrystalline thin films. BET rates for RuP-SnO2 and RuP-TiO2 are correlated with the distribution, identity, and occupation of localized trap states within the nanocrystalline metal oxide films, which are pH specific."
According to the news editors, the research concluded: "Recombination between injected electrons and oxidized chromophores is influenced by the identity of metal oxide localized trap states populated and the specific pathways by which BET can proceed."
For more information on this research see: Revealing the Relationship between Semiconductor Electronic Structure and Electron Transfer Dynamics at Metal Oxide-Chromophore Interfaces. Journal of Physical Chemistry C, 2013;117(48):25259-25268. Journal of Physical Chemistry C can be contacted at: Amer Chemical Soc, 1155 16TH St, NW, Washington, DC 20036, USA. (American Chemical Society - www.acs.org; Journal of Physical Chemistry C - www.pubs.acs.org/journal/jpccck)
The news editors report that additional information may be obtained by contacting R.R. Knauf, University of North Carolina, Dept. of Chem, Chapel Hill, NC 27599, United States. Additional authors for this research include M.K. Brennaman, L. Alibabaei, M.R. Norris and J.L. Dempsey.
Keywords for this news article include: Chapel Hill, Electronics, United States, Semiconductor, North Carolina, Nanotechnology, Nanocrystalline, Emerging Technologies, North and Central America
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