Section 1 offers an overview of the expanding range of low level DC measuring instruments now available to scientists and engineers, including the electrometer, digital multimeter (DMM), nanovoltmeter, picoammeter, source measure unit (SMU) instrument, low current preamp, micro-ohmmeter, and low current source. Sections 2 and 3 delve into techniques and sources of error related to measurements from high resistance and low resistance sources respectively. Both sections include a measurement optimization summary that allows readers to identify likely sources of measurement error and troubleshooting techniques at a glance. Section 4 provides useful information on configuring test setups for a wide range of low level measurement applications.
The handbook concludes with an updated instrument selection guide, an illustrated cable and connector assembly guide, glossary, and test system safety reference. A detailed index helps readers find specific topics quickly.
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