By a News Reporter-Staff News Editor at Science Letter -- Researchers detail new data in Atomic Force Microscopy. According to news reporting originating in Changzhou, People's Republic of China, by NewsRx journalists, research stated, "The core/shell structured polystyrene (PS)/SiO2 composite microspheres with different silica shell morphology were synthesized by a modified Stober method. As confirmed by transmission electron microscopy (TEM), the rough discontinuous shell consisted of separate SiO2 nanoparticles for compositeA, while the smooth continuous one was composed of amorphous silica network for composite-B."
The news reporters obtained a quote from the research from Changzhou University, "Atomic force microscopy (AFM) was employed to probe the compressive Young's moduli (E) and chemical mechanical polishing (CMP) performances of the as-prepared PS/SiO2 composite microspheres. On the basis of the Hertzian contact mechanics, the calculated E values of the PS microspheres, composite-A and composite-B were 2.9 +/- 0.4, 5.1 +/- 1.2 and 6.0 +/- 1.2 GPa, respectively. Compared to traditional abrasives, thermally grown silicon oxide wafers after polished by the core/shell PS/SiO2 composite abrasives obtained a lower root mean square roughness and a higher material removal rate value. In addition, there is an obvious effect of shell morphology of the composites on oxide CMP performance and structural stability during polishing process."
According to the news reporters, the research concluded: "This approach would provide a basis for understanding the actual role of organic/inorganic core/shell composite abrasives in the material removal process of CMP."
For more information on this research see: Compressive elastic moduli and polishing performance of non-rigid core/shell structured PS/SiO2 composite abrasives evaluated by AFM. Applied Surface Science, 2014;290():433-439. Applied Surface Science can be contacted at: Elsevier Science Bv, PO Box 211, 1000 Ae Amsterdam, Netherlands. (Elsevier - www.elsevier.com; Applied Surface Science - www.elsevier.com/wps/product/cws_home/505669)
Our news correspondents report that additional information may be obtained by contacting A.L. Chen, Changzhou Univ, Sch Mat Sci & Engn, Changzhou 213164, Jiangsu, People's Republic of China. Additional authors for this research include W.B. Mu and Y. Chen (see also Atomic Force Microscopy).
Keywords for this news article include: Asia, Changzhou, Atomic Force Microscopy, People's Republic of China
Our reports deliver fact-based news of research and discoveries from around the world. Copyright 2014, NewsRx LLC