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New Microwave Research Study Findings Have Been Reported by Investigators at Shiraz University

January 21, 2014



By a News Reporter-Staff News Editor at Journal of Technology -- Investigators publish new report on Microwave Research. According to news reporting originating in Shiraz, Iran, by VerticalNews journalists, research stated, "This article proposes a novel mutual impedance matrix model for compensating mutual coupling effects in adaptive array with application to adaptive nulling of interference signals. In the new method, extreme care has been taken into account for both self impedance and mutual impedance, relating to the mutual coupling effects."

The news reporters obtained a quote from the research from Shiraz University, "Numerical simulation results demonstrate the robustness and capability of this technique. By using the new method, it is found that both the accuracy of the positioning and depth of the nulls are significantly improved."

According to the news reporters, the research concluded: "Performance comparisons of the new methodology and several other previous techniques via a number of simulation are presented."

For more information on this research see: Adaptive Nulling of a Linear Dipole Array in the Presence of Mutual Coupling. International Journal of RF and Microwave Computer-Aided Engineering, 2014;24(1):30-38. International Journal of RF and Microwave Computer-Aided Engineering can be contacted at: Wiley-Blackwell, 111 River St, Hoboken 07030-5774, NJ, USA. (Wiley-Blackwell - www.wiley.com/; International Journal of RF and Microwave Computer-Aided Engineering - onlinelibrary.wiley.com/journal/10.1002/(ISSN)1099-047X)

Our news correspondents report that additional information may be obtained by contacting N. Parhizgar, Shiraz Univ, Dept. of Commun & Elect Engn, Fac Elect & Comp Engn, Shiraz, Iran. Additional authors for this research include M.A. Masnadi-Shirazi, A. Alighanbari and A. Sheikhi.

Keywords for this news article include: Iran, Asia, Shiraz, Microwave Research

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Source: Journal of Technology


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