By a News Reporter-Staff News Editor at Science Letter -- Investigators publish new report on Materials Science and Physical Chemistry. According to news reporting from Newark, New Jersey, by NewsRx journalists, research stated, "We study the instability of nanometric Cu thin films on SiO2 substrates. The metal is melted by means of laser pulses for some tens of nanoseconds, and during the liquid lifetime, the free surface destabilizes, leading to the formation of holes at first and then in later stages of the instability to metal drops on the substrate."
The news correspondents obtained a quote from the research from the New Jersey Institute of Technology, "By analyzing the Fourier transforms of the SEM (scanning electron microscope) images obtained at different stages of the metal film evolution, we determine the emerging length scales at relevant stages of the instability development. The results are then discussed within the framework of a long-wave model. We find that the results may differ whether early or final stages of the instability are considered. On the basis of the interpretation of the experimental results, we discuss the influence of the parameters describing the interaction of the liquid metal with the solid substrate."
According to the news reporters, the research concluded: "By considering both the dependence of dominant length scales on the film thickness and the measured contact angle, we isolate a model which predicts well the trends found in the experimental data."
For more information on this research see: Instability of Liquid Cu Films on a SiO2 Substrate. Langmuir, 2013;29(30):9378-9387. Langmuir can be contacted at: Amer Chemical Soc, 1155 16TH St, NW, Washington, DC 20036, USA. (American Chemical Society - www.acs.org; Langmuir - www.pubs.acs.org/journal/langd5)
Our news journalists report that additional information may be obtained by contacting A.G. Gonzalez, New Jersey Inst Technol, Dept. of Math Sci, Newark, NJ 07102, United States. Additional authors for this research include J.A. Diez, Y.Y. Wu, J.D. Fowlkes, P.D. Rack and L. Kondic (see also Materials Science and Physical Chemistry).
Keywords for this news article include: Newark, New Jersey, United States, North and Central America, Materials Science and Physical Chemistry
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