By Targeted News Service
ALEXANDRIA, Va., Aug. 28 -- Freescale Semiconductor, Austin, Texas, has been assigned a patent (8,522,089) developed by Deepak Jindal, Noida, India, for a "method of testing asynchronous modules in semiconductor device."
The abstract of the patent published by the U.S. Patent and Trademark Office states: "A method of testing a semiconductor device that includes first and second mutually asynchronous modules, a buffer for storing transaction data for read/write operations from the first module and transferring it to the second module synchronously with the data rate of the second module, and an inhibit input. The second module receives the transaction data from the buffer and transfers the data to a data output when the inhibit signal is de-asserted and not when the inhibit signal is asserted. The method of testing includes repeatedly: asserting the inhibit signal; providing test transaction data to the first module and storing the data in the buffer while the inhibit signal is asserted; de-asserting the inhibit signal so that the second module transfers test transaction data received from the buffer to the data output synchronously with the data rate of the second module; and capturing deterministically test transaction data from the output of the second module."
The patent application was filed on Jan. 21, 2011 (13/010,790). The full-text of the patent can be found at http://patft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PALL&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.htm&r=1&f=G&l=50&s1=8,522,089.PN.&OS=PN/8,522,089&RS=PN/8,522,089
Written by Kusum Sangma; edited by Anand Kumar.