Our news editors obtained a quote from the research from URCA, "Moreover, for structural characterization by transmission electron microscopy (TEM), an ion milling method based with the use of two ions guns was also carried out for cross-section preparation. To demonstrate the efficiency of the two developed methods, morphological investigations were done by traditional SEM and field emission gun SEM. This was followed by structural investigations through selected area electron diffraction (SAED) coupled with TEM and X-ray diffraction techniques. The results demonstrated that ionic polishing allowed to reveal a variation of the microstructure according to the surface treatment that could not be observed by acid etching preparation."
According to the news editors, the research concluded: "TEM associated to SAED and X-ray diffraction provided information regarding the nanostructure compositional changes induced by the duplex SMAT/nitriding process."
For more information on this research see: Microstructural characterization of Ti-6Al-4V alloy subjected to the duplex SMAT/plasma nitriding.
The news editors report that additional information may be obtained by contacting Y. Pi, LISM EA, URCA, 21 rue
Keywords for this news article include: Reims,
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