Boston, MA (PRWEB) November 05, 2013
Bloomy Controls, Inc. today announced at NIDays North America 2013 the introduction of the compactUTS™ electronics functional test platform that enables design and manufacturing engineers to quickly create automated test solutions for mixed-signal connectorized printed circuit board assemblies and electronic subassemblies. The compactUTS functional tester improves productivity and competitiveness of high-mix manufacturing operations by simplifying the reuse of its general purpose instrumentation and switches through its robust interconnect; allowing quick connection of devices under test (DUT) via DUT-specific cables, all under the control of a PC running National Instruments software. Small and simple for operators to employ on the manufacturing line, the compactUTS is also easy to program by test engineers using the included compactUTS NI LabVIEW drivers and optional Universal Test System (UTS) Software Suite for NI TestStand.
Versatile instruments power the compactUTS under the control of a standard PC or laptop computer via USB interface, including an NI USB-4065 DMM, NI USB-6341 data acquisition device, and a Bloomy Controls switch matrix and power control module. These instruments are interfaced through a high-density Virginia Panel Corporation (VPC) i1 jack on the desktop enclosure, providing a mass interconnect for test cable mating to the DUT. Each DUT-specific cable contains a unique electronic key that assures the proper test procedure executes for the attached device with up to 65 test points under 50V.
LabVIEW developers benefit from the included compactUTS drivers, and TestStand developers can dramatically reduce test sequence creation effort by using an optional UTS Software Suite that abstracts the compactUTS functionality to a collection of configurable test steps in TestStand. Test sequences for the compact UTS can migrate seamlessly to the Bloomy Controls UTS, a full-featured electronics functional test platform for PCBAs and subassemblies of any complexity.
"The compactUTS is an excellent demonstration of the scalability of our graphical system design platform in an active community of users and partners – specifically with Bloomy Controls, an NI Platinum Alliance Partner," said Luke Schreier, Senior Group Manager for Automated Test at National Instruments. "Their clever integration of National Instruments hardware and software helps customers improve productivity and product quality, both of which are necessary with the increasing complexity of modern devices under test."
"The compactUTS empowers electronic design, manufacturing and test engineers to quickly and easily create automated test solutions," says David Moschella, Product Marketing Manager for Bloomy Controls, Inc. "It is particularly beneficial for manufacturers and contract manufacturers producing a mixture of low-complexity electronic products who want to replace time-consuming manual or partially automatic processes with a flexible, reusable automated test platform composed of industry standard hardware and software."
About Bloomy Controls, Inc.
Bloomy Controls, Inc. provides industry-leading systems for automated test, data acquisition, and control. The company is a 21-year member of the National Instruments (NI) Alliance Partner Network, maintaining the top-tier Platinum or Select status since the accreditation’s inception in 1999. Bloomy Controls was recently honored with NI’s Most Outstanding Technical Resources Award, as recognition of the company’s best-in-the-world team of engineers using NI hardware and software. The company is also an NI Electronic Design Specialty Alliance Partner and Vision Specialty Alliance Partner.
LabVIEW, National Instruments, NI, TestStand, and ni.com are trademarks of National Instruments. The Universal Test System and compactUTS are trademarks of Bloomy Controls, Inc. Other product and company names listed are trademarks or trade names of their respective companies.
Read the full story at http://www.prweb.com/releases/Bloomy/compactUTS/prweb11299969.htm