By a News Reporter-Staff News Editor at Science Letter -- Investigators discuss new findings in Microscopy. According to news reporting originating from Barcelona, Spain, by NewsRx correspondents, research stated, "A recently developed technique based on the transmission electron microscope, which makes use of electron beam precession together with spot diffraction pattern recognition now offers the possibility to acquire reliable orientation/phase maps with a spatial resolution down to 2 nm on a field emission gun transmission electron microscope."
Our news editors obtained a quote from the research from the University of Barcelona, "The technique may be described as precession-assisted crystal orientation mapping in the transmission electron microscope, precession-assisted crystal orientation mapping technique-transmission electron microscope, also known by its product name, ASTAR, and consists in scanning the precessed electron beam in nanoprobe mode over the specimen area, thus producing a collection of precession electron diffraction spot patterns, to be thereafter indexed automatically through template matching. We present a review on several application examples relative to the characterization of microstructure/microtexture of nanocrystalline metals, ceramics, nanoparticles, minerals and organics."
According to the news editors, the research concluded: "The strengths and limitations of the technique are also discussed using several application examples."
For more information on this research see: Orientation and phase mapping in the transmission electron microscope using precession-assisted diffraction spot recognition: state-of-the-art results. Journal of Microscopy, 2013;252(1):23-34. Journal of Microscopy can be contacted at: Wiley-Blackwell, 111 River St, Hoboken 07030-5774, NJ, USA. (Wiley-Blackwell - www.wiley.com/; Journal of Microscopy - onlinelibrary.wiley.com/journal/10.1111/(ISSN)1365-2818)
The news editors report that additional information may be obtained by contacting D. Viladot, University of Barcelona, Center Tecnol, Barcelona, Catalunya, Spain. Additional authors for this research include M. Veron, M. Gemmi, F. Peiro, J. Portillo, S. Estrade, J. Mendoza, N. Llorca-Isern and S. Nicolopoulos (see also Microscopy).
Keywords for this news article include: Spain, Europe, Barcelona, Microscopy
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