By a News Reporter-Staff News Editor at Journal of Technology -- Researchers detail new data in Thin Solid Films. According to news reporting originating from Plzen, Czech Republic, by VerticalNews correspondents, research stated, "In this work, we have employed high-resolution transmission electron microscopy (HRTEM), X-ray photoelectron spectroscopy (XPS) and nano indentation to study the microstructure and the mechanical properties of Si-B-C-N films treated at high temperatures. Si-B-C-N films with a chemical composition of Si30-32B10-12C2-4N49-51 were deposited in a 50% Ar/50% N-2 gas mixture by pulsed DC magnetron sputtering."
Our news editors obtained a quote from the research from the University of West Bohemia, "In order to study the microstructure at elevated temperatures of the films, they were subjected to annealing at temperatures up to (i) 1400 degrees C in He and (ii) 1700 degrees C in air. XPS studies showed that annealing to 1400 degrees C in He does not affect the chemical composition of the film, while annealing to 1700 degrees C in air results in the oxidation of the film via the loss of N and B and formation of SiOx. HRTEM studies demonstrated that the as-deposited film and the film annealed to 1400 Tin He are amorphous. A three-layer structure was found in the film annealed to 1700 degrees C in air: the original amorphous Si-B-C-N base-layer, a transition nanocomposite layer consisting of BN nanocrystals embedded in a SiOx amorphous matrix and an amorphous SiOx top layer. The present evidence suggests that O reacts with Si in the Si-B-C-N amorphous structure resulting in the formation of SiOx and concomitant nucleation of BN crystals at the base/transition layer interface. Nano-indentation tests show that the film annealed to 1400 degrees C in He has a hardness of 22.1 GPa and a modulus of 210.8 GPa, higher than that of the as-deposited film (19.5 and 204.9 GPa), whereas the values for the film annealed to 1700 degrees C in air (9.8 and 76.5 GPa) simply reflect those of the SiOx top layer."
According to the news editors, the research concluded: "The high oxidation resistance of the films is attributed to the presence of BN in front of the base layer interface that can act as a barrier to O diffusion. ."
For more information on this research see: Microstructure characterization of high-temperature, oxidation-resistant Si-B-C-N films. Thin Solid Films, 2013;542():167-173. Thin Solid Films can be contacted at: Elsevier Science Sa, PO Box 564, 1001 Lausanne, Switzerland. (Elsevier - www.elsevier.com; Thin Solid Films - www.elsevier.com/wps/product/cws_home/504106)
The news editors report that additional information may be obtained by contacting J. He, Univ W Bohemia, Dept. of Phys, Plzen 30614, Czech Republic. Additional authors for this research include M.H. Zhang, J.C. Jiang, J. Vlcek, P. Zeman, P. Steidl and E.I. Meletis.
Keywords for this news article include: Plzen, Europe, Czech Republic, Thin Solid Films
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